Attackers Can Do Better: Over- and Understated Factors of Model Stealing Attacks

Attackers Can Do Better: Over- and Understated Factors of Model Stealing Attacks

Authors
  • Oliynyk, Daryna
  • Mayer, Rudolf
  • Rauber, Andreas
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Shortfacts
Category
Paper in Conference Proceedings or in Workshop Proceedings (Paper)
Event Title
IEEE Conference on Secure and Trustworthy Machine Learning (SaTML)
Divisions
Security and Privacy
Subjects
Computersicherheit
Angewandte Informatik
Event Location
University of Copenhagen, Denmark
Event Type
Conference
Event Dates
9-11 April 2025
Date
1 April 2025
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